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Sophia He
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Shenzhen Mustech Electronics Co., Limited
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Sophia He
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Quality Control
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Certifications
- CE
- 2014-10-09
- 0000-00-00
- CE
- 2012-04-25
- 0000-00-00
- CE
- 2011-10-26
- 0000-00-00
- ISO9001
- 2015-05-28
- 2018-05-28
Contact Supplier
- Shenzhen Mustech Electronics Co., Limited
- Contact nameSophia He Chat Now
- Phone86-755-23155705
- Address3/F, Bldg. 2, Plant B, Shanghe Industry Park, Nanchang Road, Xixiang Street, Baoan District, Shenzhen, Guangdong, China
New Products
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Used JEOL JSM - 7500F Field Emission Scanning Electron Microscope
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Used Nikon MM - 800 Measuring Microscope
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Used JEOL JEM - 9320FIB (Focused Ion Beam System)
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Used Hitachi TM3030Plus Scanning Electron Microscope (SEM)
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Used Hitachi S3400N Scanning Electron Microscope
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Used Leica Microscope INS3000
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Used Hitachi TM - 3030 Scanning Electron Microscope
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Zeiss Gemini Sigma 300 VP SEM (Variable Pressure Scanning Electron Microscope)
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Used KEYENCE VHX950F Ultra - Deep Field Microscope
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Used Olympus DSX510 Digital Microscope
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Used JEOL JSM-7400F Field Emission Scanning Electron Microscope (FE-SEM)
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Inverted metallurgical microscope MJ42
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